To develop new, reliable manufacturing and self-testing methods for systems and components in harsh environments
Issues Involved or Addressed
Oscillation-based self-testing of electronics and microelectronics; Real-time DC parameter degradation monitoring in electronics; statistical analysis of test resilience over PVT variation; parametric degradation of microelectronics due to ionozing radiation; reliability of additively manufactured RF components; additively manufactured geometries and processes best suited to harsh environments.
Methods and Technologies
Academic Majors of Interest
Preferred Interests and Preparation
EE: Circuit design, microelectronic design, electromagnetics, metrology
IE: Statistical analysis, manufacturing processes
ME: Precision manufacturing, additive manufacturing, material science, FEM analysis
Physics: nuclear physics, semiconductor physics.